A Defect Model of Reliability*
نویسنده
چکیده
The same defects that degrade device yield also affect device reliability. The complete theory is complicated and depends on factors such as die size, defect density, defect size distribution, circuit layout density, and environmental stress. We analyze the simplifying assumptions necessary for a practical model. Then we show how to use the practical model to extract process-specific reliability models, and thereby estimate failure rates of complex products, without reliance on full product-specific reliability data.
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